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2D Materials and Localised Electric Fields

Monolayers are in several ways ideal sample material for electron microscopy. We apply aberration-corrected STEM and EELS to investigate new 2D materials at the atomic scale.

Publications

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Daria Kieczka et al.

Electronic Structure 5, 024001 (2023)

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Roger Guzman et al.

ACS Nano 17, 2450−2459 (2023)

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Zhepeng Zhang et al.

Advanced Optical Materials 10, 2201350 (2022)

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Han Xiao et al.

Advanced Materials Interfaces 9, 2201353 (2022)

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Nam Thanh Trung Vu et al.

ACS Nano 17, 15648–15655 (2023)

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Yong Zhu et al.

iScience 24 (12) 103456 (2021)

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Leyi Loh et al.

Nano Letters, 11 June 2021

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Yue Zheng et al.

Nano Research, 1-8, 4 January 2021

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Alok Ranjan et al.

ACS Applied Materials & Interfaces 12 (49), 55000-55010, December 1 2020

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Leyi Loh et al.

Nano Research, 1-14, October 20 2020

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Ziyu Qin et al.

ACS nano 13 (9), 10768-10775, August 6 2019

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A Ranjan et al.

IEEE Electron Device Letters 40 (8), 1321-1324, 17 June 2019

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