Michel Bosman Research Group
Department of Materials Science and Engineering
2D Materials and Localised Electric Fields
Monolayers are in several ways ideal sample material for electron microscopy. We apply aberration-corrected STEM and EELS to investigate new 2D materials at the atomic scale.
Publications
H. Zhang et al.
Advanced Materials 24, 19112 (2025)
Haidong Liang et al.
ACS Nano 19, 15130−15138 (2025)
Charlie W. F. Freeman et al.
ACS Nano 19, 16024-16031 (2025)
Daria Kieczka et al.
Nanoscale 17, 10082 (2025)
Leyi Loh et al.
ACS Nano 19, 6195 (2025)
Leyi Loh et al.
Nature Communications 15, 10035 (2024)
.jpg)
Dasari Venkatakrishnarao et al.
ACS Nano 18 (39) 26911–26919 (2024)
Yiyu Zhang et al.
ACS Nano 17, 7929 (2023)
Yuan Chen et al.
Nano Letters 23, 4456–4463 (2023)
Shoucong Ning et al.
Ultramicroscopy 248, 113716 (2023)
Daria Kieczka et al.
Electronic Structure 5, 024001 (2023)
Roger Guzman et al.
ACS Nano 17, 2450−2459 (2023)
Zhepeng Zhang et al.
Advanced Optical Materials 10, 2201350 (2022)
Han Xiao et al.
Advanced Materials Interfaces 9, 2201353 (2022)
Nam Thanh Trung Vu et al.
ACS Nano 17, 15648–15655 (2023)
Haidong Liang et al.
Nano Research (2022)
Shoucong Ning et al.
Microscopy and Microanalysis 28 (3), 622 (2022)
Yong Zhu et al.
iScience 24 (12) 103456 (2021)
Yesheng Li et al.
Nature Electronics, 17 May 2021
Leyi Loh et al.
Nano Letters, 11 June 2021
Yue Zheng et al.
Nano Research, 1-8, 4 January 2021
Alok Ranjan et al.
ACS Applied Materials & Interfaces 12 (49), 55000-55010, December 1 2020
Leyi Loh et al.
Nano Research, 1-14, October 20 2020
Ziyu Qin et al.
ACS nano 13 (9), 10768-10775, August 6 2019
A Ranjan et al.
IEEE Electron Device Letters 40 (8), 1321-1324, 17 June 2019