Microelectronics

Publications

Molecular Bridges Link Monolayers of Hexagonal Boron Nitride during Dielectric Breakdown

Alok Ranjan et al.

ACS Applied Electronic Materials 5, 1262−1276 (2023)

Tunable quantum gaps to decouple carrier and phonon transport leading to high-performance thermoelectrics

Yong Yu et al.

Nature Communications 13, 5612 (2022)

Patterning at the Resolution Limit of Commercial Electron Beam Lithography

Mohammad S.M. Saifullah et al.

Nano Letters 22, 7432−7440 (2022)

Controlling the Wet-Etch Directionality in Nanostructured Silicon

Zainul Aabdin et al.

ACS Applied Electronic Materials 4, 5191−5198 (2022)

Strain-induced van der Waals gaps in GeTe revealed by in situ nanobeam diffraction

Yong Yu et al.

Science Advances 8, eadd7690 (2022)

Gate-Defined Quantum Confinement in CVD 2D WS2

Chit Siong Lau et al.

Advanced Materials 34 (25), 2270189 (2022)

Light-Emitting V-Pits: An Alternative Approach toward Luminescent Indium-Rich InGaN Quantum Dots

Jing-Yang Chung et al.

ACS Photonics 8 (10) 2853 (2021)

The Nature of Column Boundaries in Microstructured Silicon Oxide Nanolayers

Kamal Pate et al.

APL Materials 9, 121107 (2021)

Anomalous resistive switching in memristors based on two-dimensional palladium diselenide using heterophase grain boundaries

Yesheng Li et al.

Nature Electronics 4, 348 (2021)

Unlocking the origin of compositional fluctuations in InGaN light emitting diodes

Tara P Mishra et al.

Physical Review Materials 5 (2), 024605 (2021)

Localized Probing of Dielectric Breakdown in Multilayer Hexagonal Boron Nitride

Alok Ranjan et al.

ACS Applied Materials & Interfaces 12 (49), 55000-55010 (2020)

3D characterization of hard breakdown in RRAM device

S Mei et al.

Microelectronic Engineering 216, 111042 (2019)

An oxygen vacancy mediated Ag reduction and nucleation mechanism in SiO2 RRAM devices

K Patel et al.